Additional Features:

• 40/43 Gb/s optical and electrical interfaces in a single instrument
• SDH STM-256 and SONET OC-768 concatenated and fully structured signals
• OTM0.3 with PRBS or SDH/SONET client
• Unframed 39.813 Gb/s and 43.018 Gb/s BER testing
• Alarm, error, overhead, and pointer generation and analysis
• Jitter/Wander generation and analysis for 40/43 Gb/s

The JDSU ONT-506 enables evaluation and characterization of 40/43 Gb/s electrical/optical devices. The ONT-506 supports unframed BER testing, and framed SDH/SONET/OTN functional testing including jitter/wander generation and analysis.

The modular concept starts with 3 slots for 40 Gb/s optical framed and unframed. Further modules can be added to enable electrical interfaces and jitter/wander applications. In addition, the programmable hardware architecture allows to add a payload module for the combined OTN with SDH/SONET client testing and to assure the future-proof for further applications.